Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Format: | eBook |
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Published: |
Bellingham, Wash.
SPIE
2012
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Series: | Proceedings of SPIE
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Online Access: | |
Collection: | SPIE Conference Proceedings - Collection details see MPG.ReNa |
ISBN: | 9780819488930 |
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