Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...

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Bibliographic Details
Main Author: Egerton, R.F.
Format: eBook
Language:English
Published: New York, NY Springer US 2005, 2005
Edition:1st ed. 2005
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Description
Summary:Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy
Physical Description:XII, 202 p. 122 illus online resource
ISBN:9780387260167