1505.1-2008 - IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2008
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| Subjects: | |
| Online Access: | |
| Collection: | IEEE Standards - Collection details see MPG.ReNa |
| ISBN: | 9780738185378 |
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