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1500-2005 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2005
Subjects:
Components, Circuits, Devices And Systems
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Standards - Collection details see MPG.ReNa
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Description
ISBN:9780738146942

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