1181-1991 - IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
1991
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| Collection: | IEEE Standards - Collection details see MPG.ReNa |
| ISBN: | 0738123889 |
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