1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2010
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| Subjects: | |
| Online Access: | |
| Collection: | IEEE Standards - Collection details see MPG.ReNa |
| ISBN: | 9780738161532 |
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