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2000 5th International Workshop on Statistical Metrology (Cat.No.00TH8489

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2000
Subjects:
General Topics For Engineers
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:0780358961

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