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Testing: Academic & Industrial Conference - Practice and Research Techniques (taic part 2008)

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2008
Subjects:
General Topics For Engineers
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:9780769533834
9781509076642

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