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2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems (IEEE Cat. No.02EX545)

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2002
Subjects:
Computing And Processing; Signal Processing And Analysis
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:0780373448

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