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2009 3rd International Symposium on Empirical Software Engineering and Measurement

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2009
Subjects:
Computing And Processing
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:9781509069859
9781424448425

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