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00736nmm a2200181 u 4500 |
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EB000308324 |
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EBX01000000000000000107177 |
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00000000000000.0 |
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110826 ||| |
020 |
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|a 076952706X
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020 |
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|a 9781509097937
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245 |
0 |
0 |
|a 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
|h Elektronische Ressource
|
260 |
|
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|a New York
|b The Institute of Electrical and Electronics Engineers, Inc.
|c 2006
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653 |
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|a Components, Circuits, Devices and Systems; General Topics for Engineers
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989 |
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|b IEEEPROC
|a IEEE Conference Proceedings
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856 |
4 |
0 |
|u https://ieeexplore.ieee.org/servlet/opac?punumber=4030903
|x Verlag
|3 Volltext
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082 |
0 |
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|a 600
|