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Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2003
Subjects:
Components, Circuits, Devices And Systems; Engineered Materials, Dielectrics And Plasmas; Fields, Waves And Electromagnetics; General Topics For Engineers
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:0780377222

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