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2010 International Conference on Measuring Technology and Mechatronics Automation

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2010
Subjects:
Computing And Processing; Signal Processing And Analysis; Components, Circuits, Devices And Systems; Power, Energy And Industry Applications; Robotics And Control Systems
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:9781424450015
9781424457397

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