MPG.eBooks - Description: 26th IEEE VLSI Test Symposium (vts 2008)

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Bibliographic Details
Format:	eBook
Published:	New York The Institute of Electrical and Electronics Engineers, Inc. 2008
Subjects:	Components, Circuits, Devices And Systems; Engineered Materials, Dielectrics And Plasmas; Computing And Processing; Signal Processing And Analysis
Online Access:	https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection:	IEEE Conference Proceedings - Collection details see MPG.ReNa

Description
ISBN:	9781509081769 9780769531236