2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2008
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| Collection: | IEEE Conference Proceedings - Collection details see MPG.ReNa |
| ISBN: | 9781509077441 9781424416165 |
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