MPG.eBooks - Description: 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT).

Read Now

Bibliographic Details
Format:	eBook
Published:	New York The Institute of Electrical and Electronics Engineers, Inc. 2005
Subjects:	Components, Circuits, Devices And Systems; Engineered Materials, Dielectrics And Plasmas; Computing And Processing; Signal Processing And Analysis
Online Access:	https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection:	IEEE Conference Proceedings - Collection details see MPG.ReNa

Description
ISBN:	0780390601 9781538602263