2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2010
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| Subjects: | |
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| Collection: | IEEE Conference Proceedings - Collection details see MPG.ReNa |
| ISBN: | 9781424483433 9781424483440 |
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