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2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2010
Subjects:
Power, Energy And Industry Applications; Communication, Networking And Broadcast Technologies; Components, Circuits, Devices And Systems; Engineered Materials, Dielectrics And Plasmas; Signal Processing And Analysis
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Conference Proceedings - Collection details see MPG.ReNa
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ISBN:9781424483433
9781424483440

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