IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
1989
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| Online Access: | |
| Collection: | IEEE Conference Proceedings - Collection details see MPG.ReNa |
| Description not available. |